The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Feb. 15, 2002
Yoshiaki Togawa, Kyoto, JP;
Yoshiaki Togawa, Kyoto, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
A particle size distribution measuring apparatus which can enhance the precision and the reliability of measurements by eliminating the region of the particle size having inferior measuring precision and resolution is disclosed. In one embodiment, the particle size distribution measuring apparatus has a cell for receiving particles, a light source section for irradiating laser lights with a plurality of wavelengths to the cell, a detector for measuring the intensity of a direct light passing through the cell and the scattered lights at a plurality of scattering angles, and an arithmetic processing section which determines the particle size distribution by using the laser light of one wavelengths for the region of the particle size having low sensitivity at another wavelength in the whole range of the particle size to be measured to compensate the sensitivity of the region.