The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2005

Filed:

Jun. 19, 2003
Applicants:

Eric Hillenbrand, Evansville, IN (US);

Mark Dombrowski, Escondido, CA (US);

Jim Lorenz, Escondido, CA (US);

Ming-de LI, San Diego, CA (US);

Eric Ford, LaCanada, CA (US);

Inventors:

Eric Hillenbrand, Evansville, IN (US);

Mark Dombrowski, Escondido, CA (US);

Jim Lorenz, Escondido, CA (US);

Ming-De Li, San Diego, CA (US);

Eric Ford, LaCanada, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L025/00 ;
U.S. Cl.
CPC ...
Abstract

A two band imaging system having two focal plane array detectors, a beam splitter, and an enclosure. The beam splitter disposed within the system at an angle to the optical axis such that light entering the system is split and is simultaneously directed to each of the two focal plane array detectors. The two focal plane array detectors and beam splitter are disposed within the enclosure.


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