The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Jul. 29, 2003
Applicants:
Yong HU, Union City, CA (US);
Eric Kenneth Dahlin, San Jose, CA (US);
Shih-fu Lee, Fremont, CA (US);
Hamid F. Ghazvini, San Jose, CA (US);
Elias Ted Johnson, Jr., Apple Valley, MN (US);
Inventors:
Yong Hu, Union City, CA (US);
Eric Kenneth Dahlin, San Jose, CA (US);
Shih-Fu Lee, Fremont, CA (US);
Hamid F. Ghazvini, San Jose, CA (US);
Elias Ted Johnson, Jr., Apple Valley, MN (US);
Assignee:
Seagate Technology, Scotts Valley, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B005/28 ;
U.S. Cl.
CPC ...
Abstract
A system and a method for measuring micro-waviness of a magnetic recording disk using a high-speed glide test are disclosed. The HSG test is a viable production-level test methodology for high performance media that require well-controlled and low micro-waviness.