The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
May. 16, 2003
Robert E. Schafrik, Cincinnati, OH (US);
Matthew B. Buczek, Fairfield, OH (US);
Ramgopal Darolia, West Chester, OH (US);
Steven R. Leclair, Dayton, OH (US);
John F. Maguire, Helotes, TX (US);
William C. Fitzgerald, Medway, OH (US);
Robert E. Schafrik, Cincinnati, OH (US);
Matthew B. Buczek, Fairfield, OH (US);
Ramgopal Darolia, West Chester, OH (US);
Steven R. LeClair, Dayton, OH (US);
John F. Maguire, Helotes, TX (US);
William C. Fitzgerald, Medway, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A non-destructive method of detecting subsurface defects in thermal barrier coatings applied to gas turbine engine components is provided. In an exemplary embodiment, the method includes positioning a evanescent microwave microscope probe adjacent a turbine component surface coated with a thermal barrier coating, and scanning the thermal barrier coating by moving at least one of the evanescent microwave microscope probe and the component surface in relation to one another in an x-y plane while maintaining a predetermined distance between the probe and the thermal barrier coating constant.