The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Apr. 29, 2003
Hegeon Kwun, San Antonio, TX (US);
Sang-young Kim, San Antonio, TX (US);
Glenn M. Light, San Antonio, TX (US);
Hegeon Kwun, San Antonio, TX (US);
Sang-Young Kim, San Antonio, TX (US);
Glenn M. Light, San Antonio, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
The present invention is for a simple, reliable and inexpensive method to calibrate a defect signal to determine the size of a defect in a pipe. A first reflected signal is received from the test area of the pipe. After attaching a clamp, a second reflected signal is received from the test area of the pipe. If defects are in the test area, by appropriate calculations using the first reflected signal and the second reflected signal, the size of the defect can be determined.