The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6968483 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 22, 2005

Filed:

Oct. 15, 2001
Applicant:

Udo Hartmann, München, DE;

Inventor:

Udo Hartmann, München, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C029/00 ;
U.S. Cl.
CPC ...
Abstract

A data memory to be tested is connected to a processing unit. Data items to be stored are produced from a test pattern data item in the processing unit and are stored in the data memory. The data memory is tested in that the test pattern data items are received from a test device, processed using a first function to form data items to be stored, and the data items are then stored. After the stored data items are read from the memory they are processed with a second function to form test data items whose number is once more smaller than the stored data items that are read from the memory.


Find Patent Forward Citations

Quick Actions:

Hartmann, Udo. (2005). Circuit and method for testing a data memory (U.S. Patent No. 6968483). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6968483

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…