The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
May. 22, 2000
David A. Jackson, Los Gatos, CA (US);
Michael J. Robb, San Jose, CA (US);
Donald L. Walchuk, Conway, AR (US);
David A. Jackson, Los Gatos, CA (US);
Michael J. Robb, San Jose, CA (US);
Donald L. Walchuk, Conway, AR (US);
Snap-On Incorporated, Pleasant Prairie, WI (US);
Abstract
An apparatus and method for calibrating machine vision measuring systems that have more than one camera are disclosed. A first calibration target is mounted in a fixed relationship to a first camera of the machine vision measuring system. A third camera mounted in a fixed relationship to a second camera of the machine vision measuring system. Second and third calibration targets are mounted in a fixed relationship to one another and viewable by the first camera and by the third camera. A data processor is programmed to compute calibration of the first camera and the second camera, based on a position of the second calibration target relative to the third calibration target and a position of the first camera with respect to the third camera. The apparatus and method provide a way to continuously measure the positions of the cameras used in the measuring system to calibrate the system.