The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2005

Filed:

Jul. 18, 2003
Applicants:

Shigeo Kittaka, Osaka, JP;

Kazuaki Oya, Osaka, JP;

Keiji Tsunetomo, Osaka, JP;

Vladimir V. Serikov, Somerset, NJ (US);

Inventors:

Shigeo Kittaka, Osaka, JP;

Kazuaki Oya, Osaka, JP;

Keiji Tsunetomo, Osaka, JP;

Vladimir V. Serikov, Somerset, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F001/295 ;
U.S. Cl.
CPC ...
Abstract

A diffraction device using a photonic crystal includes a diffraction grating, which has a period and periodically divides electromagnetic waves, and an input medium and an output medium, which contact the diffraction grating. The input medium is air, and the output medium is a one-dimensional layer having a periodic characteristic in a single direction (Z axis direction). The photonic crystal is formed by a periodic multilayer film having a period corresponding to the sum of the thickness of a first substance and the thickness of a second substance, which are superimposed. The diffraction device drastically decreases the resolution corresponding to the difference of the separated frequencies.


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