The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Apr. 06, 2004
Waldo S. Hinshaw, Burlingame, CA (US);
Waldo S. Hinshaw, Burlingame, CA (US);
Other;
Abstract
Two-dimensional or three-dimensional images of the distribution of a property of an object are formed by passing rays of radiation through the object and detecting how much each ray is attenuated. The Fourier transform is taken of each individual ray but only the zeroth term of the transform along the path of the ray is retained. Each of these transforms is added into a two or thee-dimensional array. If the three-dimensional distribution is being imaged, the transform is a plane of numbers, which is added into the three-dimensional array at right angles to the path of the ray. The numbers in the array are corrected for the non-uniform density of data. After enough such rays in enough different directions are applied, the distribution of the property is obtained by taking the inverse Fourier transform of the data in the array.