The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Jun. 09, 2004
Francis J. O'brien, Jr., Newport, RI (US);
Chung T. Nguyen, Austin, TX (US);
Francis J. O'Brien, Jr., Newport, RI (US);
Chung T. Nguyen, Austin, TX (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A method is provided for automatically characterizing data sets containing data points described by d-dimensional vectors obtained by measurements, such as with sonar arrays, as either random or non-random. The data points are located by the d-dimensional vectors in a d-dimensional Euclidean space which may comprise any number d of dimensions and may comprise more than three dimensions. Large or small sets of data may be analyzed. A virtual volume is determined which contains data points from the maximum and minimums of the d-dimensional vectors. The virtual volume is then partitioned. The probability of each partition containing at least one data point for a random distribution is compared to a measurement of the number of partitions actually containing at least one data point whereby the data set is characterized as either random or non-random.