The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Sep. 06, 2002
Applicant:
Kee Teok Park, Kyoungki-do, KR;
Inventor:
Kee Teok Park, Kyoungki-do, KR;
Assignee:
Hynix Semiconductor Inc., Kyoungki-Do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C029/00 ;
U.S. Cl.
CPC ...
Abstract
A semiconductor memory test device is capable of reducing the test time and increasing test reliability by applying an effective stress in a burn-in level or a wafer level. The semiconductor memory test device controls a sense amplifier using an additional sense amplifier driving signal when a 2rb pattern stress is applied. Therefore, the semiconductor memory test device applies a uniform stress by applying the constant supply voltage to a cell corresponding to the entire wordlines.