The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2005

Filed:

Dec. 29, 2004
Applicant:

Minoru Sukekawa, Ina, JP;

Inventor:

Minoru Sukekawa, Ina, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B021/00 ;
U.S. Cl.
CPC ...
Abstract

A microscope is provided which includes a frame which supports a stage that is adapted to have a specimen placed thereon, an arm provided on the frame to support an objective lens, an observation optical system provided on the arm, and an illumination optical system which includes a light source for illuminating the specimen and which is integrated with the frame. A fastening mechanism fastens the arm and the frame together via at least one spacer, which is provided between the arm and the frame. The spacer has a coefficient of thermal expansion that is different from the coefficient of thermal expansion of the arm. When a temperature of the frame rises due to operation of the light source, the objective lens is moved toward the stage due to the difference in coefficients of thermal expansion between the spacer and the arm.


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