The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Jul. 26, 2002
Applicant:
Holger Birk, Meckesheim, DE;
Inventor:
Holger Birk, Meckesheim, DE;
Assignee:
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F001/33 ;
U.S. Cl.
CPC ...
Abstract
An optical arrangement for spatially separating an illumination light beam and a detection light beam includes an acousto-optical component that splits the detection light beam by birefringence. A compensation element is provided that compensates, in a single passage of the detection light beam, for the splitting of the detection light beam.
Quick Actions:
Birk, Holger. (2005). Optical arrangement and scan microscope (U.S. Patent No. 6967764). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6967764
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