The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2005

Filed:

Oct. 05, 2001
Applicants:

Winfried Denk, Hekielberg, DE;

Michale Sean Fee, New Vernon, NJ (US);

Fritjof Helmchen, Heidelberg, DE;

David William Tank, Princeton, NJ (US);

Inventors:

Winfried Denk, Hekielberg, DE;

Michale Sean Fee, New Vernon, NJ (US);

Fritjof Helmchen, Heidelberg, DE;

David William Tank, Princeton, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B011/24 ;
U.S. Cl.
CPC ...
Abstract

An optical scanning system includes a probe and a processor. The probe includes a mechanical oscillator responsive to AC voltage signals and an optical fiber. The optical fiber has a free end that executes an oscillatory scanning motion in response to being mechanically driven by the mechanical oscillator. The processor is configured to receive measured intensities of light emitted from spots of a sample scanned by light from the free end of the optical fiber. The processor is also configured to assign intensities to image pixels based on the measured intensities of light. The acts of assigning compensate for variations in the density of the scanned spots.


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