The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2005

Filed:

Oct. 06, 2004
Applicants:

Yew-tai Chieng, Singapore, SG;

John Hsieh, Cupertino, CA (US);

Greta L. Light, San Mateo, CA (US);

Inventors:

Yew-Tai Chieng, Singapore, SG;

John Hsieh, Cupertino, CA (US);

Greta L. Light, San Mateo, CA (US);

Assignee:

Finisar Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J007/24 ;
U.S. Cl.
CPC ...
Abstract

This disclosure concerns methods for calibrating optical emitters. For example, one calibration method is employed in connection with an optical transceiver that includes a laser. A range of temperatures is defined that includes low end and high end temperatures. At a first temperature, within the range, a first bias current to the laser is adjusted until the laser generates an optical signal at a first predefined power level. At a second temperature outside the range, a second bias current to the laser is adjusted until the laser generates an optical signal at a second predefined power level. If the second temperature is greater than the high end temperature, the second predefined power level is defined as less than the first predefined power level, and if the second temperature is less than the low end temperature, the second predefined power level is defined as greater than the first predefined power level.


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