The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Mar. 06, 2001
David D Grindeland, Fort Collins, CO (US);
Scott W. Parker, Loveland, CO (US);
Carlos a Bonilla, Fort Collins, CO (US);
David D Grindeland, Fort Collins, CO (US);
Scott W. Parker, Loveland, CO (US);
Carlos A Bonilla, Fort Collins, CO (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Top-down testing is a mechanism that, by setting up a central location for the modification of test documentation and test execution, provides for close proximity of the text execution and the description of the test. In particular, by providing assertions which point to the line of end user documentation being tested, as well as the associated test script code, top-down testing enables a tester easily trace back to the origin in the end user documentation reference. In addition, the tester can quickly become productive with little product knowledge or test expertise.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile