The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2005

Filed:

Aug. 12, 2002
Applicants:

Fuchu Wen, Taipei, TW;

Tony Han, Taipei, TW;

Chin-fa Hsiao, Taipei, TW;

Inventors:

FuChu Wen, Taipei, TW;

Tony Han, Taipei, TW;

Chin-Fa Hsiao, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F017/50 ;
U.S. Cl.
CPC ...
Abstract

The present invention discloses a chip fabrication procedure as well as a simulation method for chip testing with performance pre-testing. The chip fabrication procedure with performance pre-testing comprising steps of: providing a chip design; determining if the chip design is correct by using a simulation environment; determining if the chip performance meets the standards by using a performance testing process; and proceeding with production of chips. The simulation method for chip testing comprises steps of: providing a simulation environment corresponding to a chip design; providing at least one set of testing commands; executing the testing commands; and calculating the time required for completing executing the testing commands. The present invention is advantageous since the time requited for product testing is reduced and so is the fabrication cost.


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