The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
May. 30, 2001
Klaus-dieter Hilliges, San Francisco, CA (US);
Klaus-Dieter Hilliges, San Francisco, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Automated test equipment (ATE) includes a tester-per-pin architecture with a number of individual decentralized per-pin testing units, wherein each per-pin testing unit is adapted for testing a respective DUT-pin of a device under test (DUT) by emitting stimulus response signals to the respective DUT-pin and/or receiving stimulus response signals from the respective DUT-pin. Testing the DUT includes defining for a testing sequence the DUT into one or more DUT-cores representing one or more functional units of the DUT and covering one or more DUT-pins of the DUT, and assigning during the testing sequence one or more of the per-pin testing units to one or more ATE-ports, whereby each ATE-port comprises one or more of the per-pin testing units and represents an independent functional testing unit for testing one or more of the DUT-cores during the testing sequence.