The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
May. 02, 2002
Michael Stefan Blum, Aidlingen, DE;
Toni Friedrich, Eutingen, DE;
Michael Stefan Blum, Aidlingen, DE;
Toni Friedrich, Eutingen, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed are a method and system for performing regression tests in a state-dependent data processing environment where data are processed by means of at least one function having a signature of defined parameters and corresponding values. A regression test is performed using at least one pre-determined set of test data and one pre-recorded function test case corresponding to said signatures and being used to execute said at least one pre-recorded function test case. The proposed mechanism particularly comprises the step of adapting said at least one function test case or said at least one set of test data to any changed signatures caused by a state transition of said data processing system. The mechanism thus provides automated regression tests in such a data processing environment and enables re-execution of a regression test in a changed context of the underlying data processing environment.
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