The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Jul. 12, 2002
Shawn B. Smith, Palo Alto, CA (US);
Brian P. Grigsby, Austin, TX (US);
Hung J. Pham, Leander, TX (US);
Tony L. Davis, Austin, TX (US);
Manjunath S. Yedatore, Austin, TX (US);
William R. Clements, Iii, Austin, TX (US);
Shawn B. Smith, Palo Alto, CA (US);
Brian P. Grigsby, Austin, TX (US);
Hung J. Pham, Leander, TX (US);
Tony L. Davis, Austin, TX (US);
Manjunath S. Yedatore, Austin, TX (US);
William R. Clements, III, Austin, TX (US);
Applied Materials, Inc., Santa Clara, CA (US);
Abstract
A method for data mining information obtained in an integrated circuit fabrication factory ('fab') that includes steps of: (a) gathering data from the fab from one or more of systems, tools, and databases that produce data in the fab or collect data from the fab; (b) formatting the data and storing the formatted data in a source database; (c) extracting portions of the data for use in data mining in accordance with a user specified configuration file; (d) data mining the extracted portions of data in response to a user specified analysis configuration file; (e) storing results of data mining in a results database; and (f) providing access to the results.