The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Dec. 18, 2001
William F. Avrin, San Diego, CA (US);
Sankaran Kumar, San Marcos, CA (US);
Peter V. Czipott, San Diego, CA (US);
Richard J. Mcclure, San Diego, CA (US);
R. Kemp Massengill, Leucadia, CA (US);
William F. Avrin, San Diego, CA (US);
Sankaran Kumar, San Marcos, CA (US);
Peter V. Czipott, San Diego, CA (US);
Richard J. McClure, San Diego, CA (US);
R. Kemp Massengill, Leucadia, CA (US);
MedNovus, Inc., Leucadia, CA (US);
Quantum Magnetics, Inc., San Diego, CA (US);
Abstract
Methods and apparatus for minimizing the effects of temperature drift in a magnetic susceptibility measurement instrument, such as an instrument used in pre-MRI screening for the presence of ferromagnetic foreign bodies. The magnetic field source and magnetic sensors can be combined into a single, rigid unit. The stability and sensitivity required in high quality magnetic susceptibility measurements can be achieved through symmetrical design of the source-sensor unit, minimization of thermal stresses, minimization of temperature variations, use of materials with low thermal expansion coefficients, or through appropriate combinations thereof. Use of patient eye movement where an eye is being screened, use of a water bag between the patient and the instrument, or use of telemedicine to facilitate performance of the necessary computations can also be incorporated.