The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Aug. 09, 2001
Yue MA, San Jose, CA (US);
Hongmin Zhang, Santa Clara, CA (US);
Yue Ma, San Jose, CA (US);
Hongmin Zhang, Santa Clara, CA (US);
nDSP, Inc., Campbell, CA (US);
Abstract
A method and system for image resample by spatial interpolation. The method and system allow more than simple angle interpolation by allowing spatial interpolation to be performed on small angle edges. Multiple interpolation directions are established. Once an interpolation direction is selected, verifications are performed on the selected interpolation direction in order to rule out erroneous selection. If the selected interpolation direction passes all verification, then spatial interpolation will be performed along the selected interpolation direction. Otherwise, a default interpolation direction is used as the interpolation direction.