The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Apr. 05, 2001
Thomas Eliott Lee, Cupertino, CA (US);
Inchan Choi, Naperville, IL (US);
Byoung IN Suh, Oakbrook, IL (US);
Thomas Eliott Lee, Cupertino, CA (US);
Inchan Choi, Naperville, IL (US);
Byoung In Suh, Oakbrook, IL (US);
Other;
Abstract
A measuring device for calculating sample volumes and changes in sample volumes is disclosed. The device includes a rotatable platform upon which the sample is placed and rotated in increments with an image of the sample being recorded at each rotational position to which the sample is rotated. The recorded images are digitized and outlined such that the outline can be divided into a plurality of parallel slices. The volume of each slice is calculated by calculating the volume of each portion of the slice represented by each image. The portions are then summed to provide the volume of each slice with the volume of each slice then being summed to provide the volume of the total sample. The device further includes a display apparatus to enable an operator to not only view before and after calculated volumes, but to be provided with a graphical display of the shape of the sample both before and after an event which changes the volume of the sample.