The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Mar. 12, 2001
Applicants:
Kouichi Shimamura, Nagano, JP;
Gen Kamurai, Nagano, JP;
Inventors:
Kouichi Shimamura, Nagano, JP;
Gen Kamurai, Nagano, JP;
Assignee:
Fujitsu Nagano Systems Engineering Limited, Nagano, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/00 ;
U.S. Cl.
CPC ...
Abstract
In a three-dimensional model analyzing apparatus for analyzing a physical property of a three-dimensional model, an information receiving unit receives information on a three-dimensional model as an object to be analyzed, an edge detecting unit detects an edge of the three-dimensional model, a smoothing unit smoothes the edge, and an analyzing unit analyzes the three-dimensional model in accordance with the finite element method after the edge is smoothed by the smoothing unit.