The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Jul. 10, 2000
Applicant:
Minako Ide, Yokohama, JP;
Inventor:
Minako Ide, Yokohama, JP;
Assignee:
Matsushita Electric Industrial CO, Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L027/06 ;
U.S. Cl.
CPC ...
Abstract
A frequency offset may be determined by detecting phase information for both a one-symbol difference and a two-symbol difference of a received known signal. Half a value representing the phase information detected for the two-symbol difference is averaged, for a particular interval, with a value representing the phase information detected for the one-symbol difference. The frequency offset is determined from the average.
Ide, Minako. (2005). Frequency offset quantity detecting apparatus (U.S. Patent No. 6965654). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6965654
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile