The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2005

Filed:

Feb. 12, 2003
Applicants:

Matthew B. Johnson, St. Paul, MN (US);

Richard C. Allen, Lilydale, MN (US);

Fred J. Roska, Woodbury, MN (US);

Steven J. Rhyner, St. Paul, MN (US);

William W. Merrill, White Bear Lake, MN (US);

Joan M. Strobel, Maplewood, MN (US);

Kevin M. Hamer, St. Paul, MN (US);

Inventors:

Matthew B. Johnson, St. Paul, MN (US);

Richard C. Allen, Lilydale, MN (US);

Fred J. Roska, Woodbury, MN (US);

Steven J. Rhyner, St. Paul, MN (US);

William W. Merrill, White Bear Lake, MN (US);

Joan M. Strobel, Maplewood, MN (US);

Kevin M. Hamer, St. Paul, MN (US);

Assignee:

3M Innovative Properties Company, Saint Paul, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B027/28 ; G02B005/30 ;
U.S. Cl.
CPC ...
Abstract

An optical film includes a layer of simultaneous biaxially stretched polyolefin film that is substantially non-absorbing and non-scattering for at least one polarization state of visible light. The layer has x, y, and z orthogonal indices of refraction where at least two of the orthogonal indices of refraction are not equal. The layer has an in-plane retardance of 100 nm or less and an out-of-plane retardance of 50 nm or greater.


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