The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2005

Filed:

Feb. 28, 2003
Applicants:

Tuan Vo-dinh, Knoxville, TN (US);

Alan Wintenberg, Knoxville, TN (US);

Inventors:

Tuan Vo-Dinh, Knoxville, TN (US);

Alan Wintenberg, Knoxville, TN (US);

Assignee:

Ut-Battelle, LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V003/44 ;
U.S. Cl.
CPC ...
Abstract

A scanning tunable detection system and related method for analyzing samples includes a source of time varying excitation signals and a tunable optical filter for selectively transmitting time-varying optical signals emanated from a sample following irradiation with the time varying excitation signals. A detector is provided for converting the time-varying optical signals to electrical detection signals. The system can identify components in a sample using phase sensitive or time sensitive detection. A slew scan mode can be used to permit slow scanning through spectral regions rich in information but quickly in regions without such information.


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