The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Nov. 24, 2004
Izhak Baharav, Palo Alto, CA (US);
Robert Taber, Palo Alto, CA (US);
Gregory Steven Lee, Mountain View, CA (US);
John Stephen Kofol, Sunnyvale, CA (US);
Izhak Baharav, Palo Alto, CA (US);
Robert Taber, Palo Alto, CA (US);
Gregory Steven Lee, Mountain View, CA (US);
John Stephen Kofol, Sunnyvale, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A security inspection system uses microwave radiation to image targets on a human subject or other item. The system includes an array of antenna elements that are programmable with a respective phase delay to direct a beam of microwave illumination toward a target on the human subject or item. The antenna elements are further capable of receiving reflected microwave illumination reflected from the target. A processor is operable to measure an intensity of the reflected microwave illumination to determine a value of a pixel within an image of the human subject or item. Multiple beams can be directed towards the human subject or item to obtain corresponding pixel values for use by the processor in constructing the image.