The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2005
Filed:
Oct. 07, 2003
James C. Liu, Santa Rosa, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
Robert L. Shimon, Santa Rosa, CA (US);
Paul E. Cassanego, Santa Rosa, CA (US);
Srinivas M. Sundaram, Santa Rosa, CA (US);
Shigetsune Torin, Santa Rosa, CA (US);
Richard R. Hawkins, Santa Rosa, CA (US);
James C. Liu, Santa Rosa, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
Robert L. Shimon, Santa Rosa, CA (US);
Paul E. Cassanego, Santa Rosa, CA (US);
Srinivas M. Sundaram, Santa Rosa, CA (US);
Shigetsune Torin, Santa Rosa, CA (US);
Richard R. Hawkins, Santa Rosa, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Testing is performed on a device under test. A first port of a first calibration module is connected to the device under test. A second port of the first calibration module is connected to a network analyzer. A first port of a second calibration module is connected to the device under test. A second port of the second calibration module is connected to the network analyzer. A measurement calibration and testing are performed without disconnecting the first port and the second port of the first calibration module and without disconnecting the first port and the second port of the second calibration module.