The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2005
Filed:
Aug. 12, 2003
Sandeep Gulati, La Canada, CA (US);
Sandeep Gulati, La Canada, CA (US);
ViaLogy Corp., Altadena, CA (US);
Abstract
A technique for determining events of interest within an output pattern generated from a detected image of an array of detectors where the output pattern comprises signals associated with noise, and signals associated with the events of interest which have intensities both greater and less than intensities of signals associated with noise. Quantum resonance interferometry is utilized to amplify signals associated with the events of interest having an intensity lower than the intensity of signals associated with noise, to an intensity greater than the intensity of the signals associated with noise to generate a modified output pattern. Once the desired signals are amplified, the technique determines which signals within the modified output pattern correlate with events of interest thus permitting a determination to be made whether a certain event of interest has occurred.