The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2005
Filed:
Dec. 22, 2004
Reidar Lindstedt, München, DE;
Dirk Fuhrmann, Essex Junction, VT (US);
Reidar Lindstedt, München, DE;
Dirk Fuhrmann, Essex Junction, VT (US);
Infineon Technologies AG, , DE;
Abstract
An integrated semiconductor memory that can be tested includes a control circuit and a memory cell having a selection transistor. In a normal operating mode, the integrated semiconductor memory can be controlled by applying control signals and can be switched from a normal operating mode to a test operating mode by the applying a signal combination of the control signals. In the test operating mode, the control circuit interprets a first of the control signals as a signal for turning off the selection transistor and a second of the control signals or a signal combination of the control signals as a signal for switching the selection transistor into the on state. The method enables the testing of different times between reading a data set into the memory cell and turning off the selection transistor.