The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2005
Filed:
Nov. 13, 2003
Takeshi Yamawaki, Tokyo, JP;
Takeshi Yamawaki, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
To provide a multibeam scanning optical device and an image forming apparatus using the same which can attain both of a large adjustment range and high adjustment accuracy using a plurality of adjusting units having sensitivities different from each other. There is provided a multibeam scanning optical device including: a first optical system which transforms a plurality of light beams emitted from a plurality of light source units into divergent light beams or convergent light beams; a second optical system which focuses a plurality of light beams emitted from the first optical system as a linear image in a main scanning direction in the vicinity of a deflection plane of a deflecting unit; the deflecting unit which deflects a plurality of light beams emitted from the second optical system in the main scanning direction; and a third optical system which focuses the plurality of light beams deflected by the deflecting unit on a surface to be scanned at a predetermined scanning lines gap, in which the multibeam scanning optical device further includes a plurality of adjusting units having sensitivities different from each other which change a relative gap in a sub-scanning direction of principal ray of a plurality of light beams incident in the second optical system.