The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2005
Filed:
Aug. 14, 2000
Dinesh Nair, Austin, TX (US);
Siming Lin, Austin, TX (US);
Darren Schmidt, Cedar Park, TX (US);
Nicolas Vazqúez, Austin, TX (US);
Dinesh Nair, Austin, TX (US);
Siming Lin, Austin, TX (US);
Darren Schmidt, Cedar Park, TX (US);
Nicolas Vazqúez, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A system and method for locating regions in a target image that match a template image with respect to color and pattern information. The method may comprise performing a first-pass search using color information obtained in a color characterization analysis of the template image in order to find a plurality of color match candidate locations. For each color match candidate location, a region proximal to the location may then be searched in detail, based on pattern information obtained in a pattern analysis of the template image.