The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2005
Filed:
Apr. 02, 2003
Applicants:
Ulrich Benner, Trostberg, DE;
Elmar Mayer, Nussdorf, DE;
Inventors:
Ulrich Benner, Trostberg, DE;
Elmar Mayer, Nussdorf, DE;
Assignee:
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B011/14 ; G01B011/02 ;
U.S. Cl.
CPC ...
Abstract
An optical position measuring system including a periodic grating structure and a scanning unit. The scanning unit includes a light source that directs light towards the periodic grating structure and an optical lens device that receives light from the periodic grating structure and creates an image of the periodic grating structure in an image plane, the optical lens device having a periodic lens array with a grating period, A(r) or the mutual distance between adjoining lenses of said lens array defined by the equation:wherein