The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2005

Filed:

Apr. 06, 2004
Applicants:

Alina Deutsch, Chappaqua, NY (US);

Gerard V. Kopcsay, Yorktown Heights, NY (US);

Byron L. Krauter, Round Rock, TX (US);

Barry J. Rubin, Croton-on-Hudson, NY (US);

Howard H. Smith, Beacon, NY (US);

Inventors:

Alina Deutsch, Chappaqua, NY (US);

Gerard V. Kopcsay, Yorktown Heights, NY (US);

Byron L. Krauter, Round Rock, TX (US);

Barry J. Rubin, Croton-on-Hudson, NY (US);

Howard H. Smith, Beacon, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R029/26 ; G01R021/00 ; G06F017/50 ;
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method for analyzing the noise prediction within one or more electrical circuits, wherein the electrical circuits have a power mesh grid distribution system that feeds power levels to the electrical circuits that are connected by signal wires. After identifying a driver and receiver electrical circuit to be analyzed, a power block is generated that is associated with the driver and receiver electrical circuit by partitioning an area of a power mesh grid distribution system into a power block that can be modeled with lossy transmission line techniques. Next, signal wires situated between the driver and receiver electrical circuits are partitioned into signal blocks that can be modeled with lossy transmission line techniques. Lastly, the power blocks and signal blocks associated with the electrical circuits are analyzed in order to predict the noise performance within the electrical circuits.


Find Patent Forward Citations

Loading…