The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2005
Filed:
Apr. 18, 2003
Maurizio Conti, Knoxville, TN (US);
James J. Hamill, Knoxville, TN (US);
Michael E. Casey, Knoxville, TN (US);
Mu Chen, Knoxville, TN (US);
Maurizio Conti, Knoxville, TN (US);
James J. Hamill, Knoxville, TN (US);
Michael E. Casey, Knoxville, TN (US);
Mu Chen, Knoxville, TN (US);
CTI PET Systems, Inc., Knoxville, TN (US);
Abstract
A normalization apparatus and method for a PET scanner with panel detectors for obtaining an estimate of a normalization array, for correction for count rate effects on the normalization array, and for measurement of the relation between the normalization array and the count rate. The method of the present invention is based on two quasi-independent radial and axial components, which are count rate dependent due to sensitivity changes across the detector blocks. A scatter source is disposed at the center of the FOV and a scatter-free source is disposed at the outer edge of the FOV. The method computes the normalization array through several steps which evaluate the geometric profile, the axial profile, and the correction factor. A count rate correction is introduced to extend the normalization array to any count rate.