The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2005
Filed:
Aug. 16, 2000
Determination of layer thickness or non-uniformity of layer thickness based on fluorophore additives
Scott Arnold Hanson, Longview, TX (US);
Gregory Wayne Nelson, Kingsport, TN (US);
Michael Eugene Donelson, Gray, TN (US);
Scott Arnold Hanson, Longview, TX (US);
Gregory Wayne Nelson, Kingsport, TN (US);
Michael Eugene Donelson, Gray, TN (US);
Eastman Chemical Company, Kingsport, TN (US);
Abstract
The invention provides a method for measuring the thickness, or non-uniformity of thickness, of one or more layers of a film or article such as a preform. At least one layer contains a known concentration and a substantially uniform distribution of fluorophores. The fluorophores are added to the one or more layers in sufficient quantity to impart fluorescence capable of detection by a detector when exposed to electromagnetic radiation at absorbing wavelengths. The layers of the invention may be made from polymeric material, non-polymeric material, or combinations thereof.