The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Apr. 16, 2003
Franco Motika, Hopewell Junction, NY (US);
Phillip J. Nigh, Williston, VT (US);
Phong T. Tran, Poughkeepsie, NY (US);
Franco Motika, Hopewell Junction, NY (US);
Phillip J. Nigh, Williston, VT (US);
Phong T. Tran, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for testing and diagnosing shift register latch chains coupled to logic circuits in an integrated circuit, the method including: (a) determining which of the shift register latch chains are failing by propagating a test pattern of zeros and ones through the shift register latch chains while gating which of the shift register latch chains contents are propagated into the means for generating a test signature; and (b) for each failing shift register latch chain: (b) propagating a test pattern through the shift register latch chains while gating a selected sequential group of latches in a failing shift register latch to propagate into the means for generating a test signature; (b) reducing the number of latches in the sequential group of latches; and (b) repeating steps (b) and (b) until all failing latches of the failing shift register latch chain have been determined.