The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Jan. 08, 2002
G. William Walster, Cupertino, CA (US);
Eldon R. Hansen, Los Altos, CA (US);
G. William Walster, Cupertino, CA (US);
Eldon R. Hansen, Los Altos, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
One embodiment of the present invention provides a system that solves a global optimization problem specified by a function ƒ and a set of equality constraints q(x)=0 (i=1, . . . , r), wherein ƒ is a scalar function of a vector x=(x, x, x, . . . x). During operation, the system receives a representation of the function ƒ and the set of equality constraints and stores the representation in a memory. Next, the system performs an interval equality constrained global optimization process to compute guaranteed bounds on a globally minimum value of the function ƒ(x) subject to the set of equality constraints. During this process, the system applies term consistency to a set of relations associated with the interval equality constrained global optimization problem over a subbox X, and excludes any portion of the subbox X that violates the set of relations. It also applies box consistency to the set of relations, and excludes any portion of the subbox X that violates the set of relations. Finally, the system performs an interval Newton step for the interval equality constrained global optimization problem over the subbox X. The system integrates the sub-parts of the process with branch tests designed to increase the overall speed of the process.