The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Aug. 20, 2003
Yoshihiro Sasaki, Kanagawa, JP;
Takashi Nishikawa, Tokyo, JP;
Yoshihiro Sasaki, Kanagawa, JP;
Takashi Nishikawa, Tokyo, JP;
NEC Electronics Corporation, Kanagawa, JP;
Abstract
A probe testing apparatus reads the surface shape of a contact pad in pressure contact with a contact probe, and differentiates the read surface shape to extract a multiplicity of flat parts. Next, the probe testing apparatus complements the multiplicity of flat parts to generate a reference shape, and subtracts the reference shape from an averaged surface shape to detect a plurality of recesses having a predetermined depth or more. Next, the probe testing apparatus selects one from the plurality of recesses corresponding to reference information, enlarges the selected recess outward by predetermined dimensions, and subtracts the reference shape from the initial surface shape at the position of the enlarged recess to detect an impression of the contact probe. Finally, the probe testing apparatus determines from the position and depth of the detected impression whether the contact probe is acceptable or defective. In this manner, even if the compact pad is formed with miniature irregularities on the surface thereof, the probe testing apparatus can precisely detect the impression of the contact probe from the surface shape to determine whether the contact probe is acceptable or defective.