The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Mar. 16, 2004
Michael Cosci, San Jose, CA (US);
Paul Green, Hollister, CA (US);
Garth Wade Helf, San Jose, CA (US);
Michael Cosci, San Jose, CA (US);
Paul Green, Hollister, CA (US);
Garth Wade Helf, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands, B.V., Amsterdam, NL;
Abstract
A method of yield improvement for manufactured products includes providing an identification plan for parts and processing equipment, whereby each part and each piece of equipment is given unique and traceable identification data. A database is provided into which the parts identification data and the processing equipment identification data are stored, and related. The parts are processed in at least one processing stage by the processing equipment to yield processed parts, and the processed parts are tested for defects. Problems are then identified through the testing of the processed parts. The related parts identification data and the processing equipment identification data are retrieved from the database, and the data is analyzed to trace the parts to the appropriate processing equipment. Corrections and repairs are made to the processing equipment to correct the problems. Improvement to yield of the manufactured products is then confirmed.