The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2005

Filed:

Sep. 12, 2001
Applicants:

Hideto Takeuchi, Tokyo, JP;

Katsushi Ikeuchi, Yokohama-shi, Kanagawa, JP;

Inventors:

Hideto Takeuchi, Tokyo, JP;

Katsushi Ikeuchi, Yokohama-shi, Kanagawa, JP;

Assignees:

Sony Corporation, Tokyo, JP;

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/00 ; G06T015/00 ;
U.S. Cl.
CPC ...
Abstract

A plurality of sets of range data and texture data obtained at different visual points are generated with respect to a measuring object, and relative shift processing of the range data is carried out. At a point to which the range data is shifted, corresponding points of the range data are calculated, and the correlation of the texture data is calculated on the basis of the calculated corresponding points. The minute shift of the range data, the corresponding point calculation processing, and the calculation of the correlation value of the texture data are repeatedly carried out for each minute shift of the range data. The corresponding point for the data exhibiting the highest texture correlation is outputted and the shift quantity of the range data is calculated on the basis of the outputted corresponding point.


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