The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Feb. 22, 2002
Chieko Onuma, Iwama, JP;
Yoshiki Kobayashi, Hitachi, JP;
Hisao Oodawa, Hitachinaka, JP;
Hiroshi Shojima, Hitachiota, JP;
Chieko Onuma, Iwama, JP;
Yoshiki Kobayashi, Hitachi, JP;
Hisao Oodawa, Hitachinaka, JP;
Hiroshi Shojima, Hitachiota, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In order to detect abnormal objects with a low-cost arrangement at high speeds while avoiding unwanted influence of variations of a light source and/or regularly vibrating objects in the environment concerned, there is provided a block data calculation unitinputted from a camera into blocks, an object candidate extraction unitwhich compares image data of a frame to be processed and the immediately preceding frame in units of blocks to thereby extract an abnormal object candidate in accordance with the presence or absence of edges and a longitude-to-lateral edge ratio change rate, and an object judging unitfor determining or 'judging' whether the abnormal object candidate is a true abnormal object, wherein it is an abnormal object where movement of the abnormal object candidate is traceable for a prespecified length of time period.