The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2005

Filed:

Oct. 20, 2003
Applicant:

Takashi Hayashi, Otawara, JP;

Inventor:

Takashi Hayashi, Otawara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G001/64 ;
U.S. Cl.
CPC ...
Abstract

A diagnostic X-ray system includes an imaging system that generates image data sets from shots by subjecting a patient to X-ray exposure, a supporting mechanism that supports the imaging system movably with respect to the patient, a system controller that controls the imaging system and the supporting mechanism in such a manner that shots are repeated at each of a plurality of shot positions set discretely along the body axis of the patient, and an image processing apparatus that generates another image data set covering a range wider than the field of view of the imaging system from the image data sets.


Find Patent Forward Citations

Quick Actions:

Hayashi, Takashi. (2005). X-ray diagnostic apparatus (U.S. Patent No. 6961406). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6961406

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…