The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Apr. 26, 2002
Johann Engelhardt, Schoenborn, DE;
Juergen Hoffmann, Wiesbaden, DE;
Johann Engelhardt, Schoenborn, DE;
Juergen Hoffmann, Wiesbaden, DE;
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Abstract
A method for examining a specimen () that exhibits at least two optical transition lines and is optically excitable at least with light of a first and light of a second wavelength is characterized by the step of illuminating the specimen () with illuminating light () that generates at least a multiple of the first wavelength and a multiple of the second wavelength; and by the step of detecting the detected light () proceeding from the specimen (). Also disclosed is a scanning microscope system () having at least one light source () that emits illuminating light () for illumination of a specimen (), the specimen () exhibiting at least two optical transition lines and being optically excitable at least with light of a first and light of a second wavelength, having at least one detector () for detection of the detected light () proceeding from the specimen () and an objective () for focusing the illuminating light () onto a subregion of the specimen (). The scanning microscope system is characterized in that the illuminating light () generates at least a multiple of the first wavelength and a multiple of the second wavelength.