The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2005

Filed:

Nov. 05, 2003
Applicants:

Gi Sung Pang, Taejon, KR;

Young Chul Song, Taejon, KR;

Ki Soo Kim, Kyunggi-do, KR;

Inventors:

Gi Sung Pang, Taejon, KR;

Young Chul Song, Taejon, KR;

Ki Soo Kim, Kyunggi-do, KR;

Assignees:

Korea Electric Power Corporation, Seoul, KR;

Hoseo University, Choongchungnam-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N021/00 ;
U.S. Cl.
CPC ...
Abstract

A strain measurement system includes a tunable light generator, a coupler, a fiberoptic sensor unit, and an optical detector. The tunable light generator includes a Super Luminescent light emission Diode (SLD), and a tunable Fabry-Perrot (FP) filter cascaded to an output terminal of the SLD to convert light having a wideband spectrum into discrete optical signals. The coupler receives and distributes the optical signals and passes them to a wavelength compensation device which detects wavelengths of the optical signals. The fiberoptic sensor unit receives the optical signals from the tunable light generator through the coupler and transmits a response signal corresponding to a variation of strain attributable to load. The optical detector detects the response signal output from the fiberoptic sensor through the coupler.


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