The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Dec. 19, 2001
Applicants:
Benjamin N. Eldridge, Danville, CA (US);
Carl V. Reynolds, Pleasanton, CA (US);
Inventors:
Benjamin N. Eldridge, Danville, CA (US);
Carl V. Reynolds, Pleasanton, CA (US);
Assignee:
FormFactor, Inc., Livermore, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/02 ;
U.S. Cl.
CPC ...
Abstract
A probe card covering system includes a probe card for testing a die on a wafer, the probe card having contacts adapted for electrical engagement with the die; a removable cover connected to the probe card and positionable in a first position over the contacts of the probe card, the cover being movable to a second position exposing said contacts for the engagement with the die; and, wherein the cover is movable from the first position to the second position while the probe card is located in a wafer testing machine.