The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Oct. 03, 2002
Gary Neil Burk, Powell, OH (US);
Thomas Michael Domin, Galena, OH (US);
Rodney Dale Maxson, Columbus, OH (US);
Dennis Charles Daugherty, Grove City, OH (US);
Steven Perry Sturm, Dublin, OH (US);
Gary Neil Burk, Powell, OH (US);
Thomas Michael Domin, Galena, OH (US);
Rodney Dale Maxson, Columbus, OH (US);
Dennis Charles Daugherty, Grove City, OH (US);
Steven Perry Sturm, Dublin, OH (US);
ABB Inc., Columbus, Inc., OH (US);
Abstract
A single vane shutter flag is asynchronously controlled so that a measuring system light source is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors. Source/detector hemispheres or serially connected randomly oriented fiber bundles homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.