The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Nov. 14, 2002
Dayakar Penumadu, Knoxville, TN (US);
Rongda Zhao, Knoxville, TN (US);
Erich F. Steadman, Williamsville, NY (US);
Dayakar Penumadu, Knoxville, TN (US);
Rongda Zhao, Knoxville, TN (US);
Erich F. Steadman, Williamsville, NY (US);
VisionWorks LLC, Buffalo, NY (US);
Abstract
A system and method for measuring the size, shape and distribution of particles wherein a digital image analysis based optical system characterizes the particle size distribution of granular and cohesion-less materials. The size and shape information is obtained in real time. Such an automated analysis system comprises the following four major components: 1) particle sizing hardware and software, 2) progressive scan CCD camera and stepper motor driven optical zoom system with large magnification ratio, 3) horizontal vibrating feeder, and 4) appropriate lighting system. In operation, the vibratory feeder allows the tested material free fall in front of the CCD camera. The backlight provided by a DC lighting system projects the free falling particles onto the camera's image plane. Pictures from free falling material are captured and transferred into the computer through a video frame grabber. The number of particles in each image is counted using specified intensity threshold and the size and shape of each particle is measured according to the calibration.