The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Aug. 30, 2002
Ching-ming Lai, Wakefield, MA (US);
Ching-Ming Lai, Wakefield, MA (US);
Analogic Corporation, Peabody, MA (US);
Abstract
The present invention provides a method and system for determining the position of the image of a target object or the position of the x-ray source in digital tomosynthesis, as the x-ray source is moved relative to the object so as to obtain multiple two-dimensional images of the object from multiple angles. At least one marker, characterized by a simple and known image pattern, is disposed between an x-ray source and a detector system. The shift in the image of the object, resulting from the movement of the x-ray source during tomosynthesis, is calculated to a desired resolution using the readily observable shift in the image of the marker. The x-ray source may be translated along a plane parallel to the plane of the detector system, or may be rotated about a fixed center.